![]() Ultra-high switch-density ATRE (Advanced Tester Resource Enhancement) components allowing efficient component placement on existing 520mm PCB tester platforms.Proprietary TTRE (Terminated Tester Resource Enhancement) technology, enabling parallel test of 3000 die for low test cost.The SmartMatrix 3000XP probe card’s key features include: “The SmartMatrix probe card, with its scalable MEMS probe technology, helps accelerate our customers’ yield and performance knowledge while meeting their aggressive die shrink roadmap.” “The technology built into our advanced DRAM probe cards provides customers a way to keep test costs in check, increase throughput of a test cell, and ramp to high volume production quickly,” said Matt Losey, Senior VP and GM of the Probes Business Unit at FormFactor. ![]() According to market research firm IC Insights, the 1Z DRAM node will move to high volume production late this year. Built on FormFactor’s proven and scalable DRAM probe-card architecture, the SmartMatrix 3000XP incorporates new custom electronics to enhance signal integrity while leveraging massive tester resource sharing to enable highly parallel test at the 1Z and 1α nanometer nodes. As a result, full-wafer DRAM probe cards that simultaneously test every die on the wafer must keep pace. The DRAM industry’s migration to the 1Z and 1α nanometer process node from the previous 1X and 1Y nodes continues the trend to increased die count on wafer. The new breakthrough allows the simultaneous test of approximately 1000 additional die over previous capabilities and can reduce the test cost per die by more than 25%. The new SmartMatrix 3000XP probe card allows DRAM manufacturers to test 3000 die or more in a single touchdown leveraging FormFactor’s proprietary Tester Resource Enhancement (ATRE) and MEMS probe technologies. (NASDAQ:FORM), a leading semiconductor test and measurement supplier, today announced the release of the SmartMatrix 3000XP probe card, reaching another high-throughput milestone in DRAM wafer test. LIVERMORE, CA – (Globe Newswire – May 29, 2020) – FormFactor, Inc. Whether you are looking to invest in your lab, test floor, portfolio or career, we have more information for you here. Learn More Sales & ServiceĬontact us today to learn about our products and services, or find a representative in your area to answer your sales and support questions. Follow the link below for a snapshot of some of the industries we support. Learn More IndustriesįormFactor products ensure the quality and reliability of ICs used in electronics affecting every aspect of our lives. Learn More Applicationsįrom the engineering lab to the production test floor, FormFactor’s products enable a wide range of test and measurement applications. From chip-scale to wafer probing systems, cryostats and magnetometry systems to contract test services, our solutions meet the most challenging requirements. Learn More Enabling TechnologyįormFactor offers a range of cryogenic test and measurement solutions to quantum engineers. Learn More Enabling TechnologyįormFactor's FRT metrology engineers designed SurfaceSens technology to achieve superior information about the measured sample and greater insights about product quality. Of engineering probes to meet the highly demanding requirementsĭurable, high-performance that exceeds expectations. ![]() FormFactor uses MEMS to build millions of tiny robust electrical springs capable of testing ICs over more than a million contact cycles. MEMS probes are the integral elements of our advanced wafer probe cards. Learn More Enabling TechnologyįormFactor’s Contact Intelligence combines smart hardware design, innovative software algorithms and years of experience to optimize probe contact accuracy on-wafer - enabling true, autonomous test. We offer a complete line of premium performance analytical probe stations for on-wafer probing that help increase process performance while reducing cost of ownership.
0 Comments
Leave a Reply. |